Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy
Author : Seizo Morita
Publisher : Springer Science & Business Media
Total Pages : 401
Release : 2009-09-18
ISBN 10 : 9783642014956
ISBN 13 : 364201495X
Language : EN, FR, DE, ES & NL

Noncontact Atomic Force Microscopy Book Description:

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Noncontact Atomic Force Microscopy
Language: en
Pages: 401
Authors: Seizo Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2009-09-18 - Publisher: Springer Science & Business Media

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress.
Atomic Force Microscopy
Language: en
Pages: 139
Authors: Wesley C. Sanders
Categories: Technology & Engineering
Type: BOOK - Published: 2019-10-08 - Publisher: CRC Press

This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Language: en
Pages: 488
Authors: Paula M. Vilarinho
Categories: Science
Type: BOOK - Published: 2006-03-30 - Publisher: Springer Science & Business Media

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has co
Atomic Force Microscopy
Language: en
Pages: 488
Authors: Greg Haugstad
Categories: Science
Type: BOOK - Published: 2012-09-04 - Publisher: John Wiley & Sons

This book enlightens readers on the basic surfaceproperties and distance-dependent intersurface forces one mustunderstand to obtain even simple data from an ato
Atomic Force Microscopy/Scanning Tunneling Microscopy
Language: en
Pages: 454
Authors: M.T. Bray
Categories: Technology & Engineering
Type: BOOK - Published: 2013-11-11 - Publisher: Springer Science & Business Media

The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1
Atomic Force Microscopy in Molecular and Cell Biology
Language: en
Pages: 235
Authors: Jiye Cai
Categories: Science
Type: BOOK - Published: 2018-11-03 - Publisher: Springer

The book addresses new achievements in AFM instruments – e.g. higher speed and higher resolution – and how AFM is being combined with other new methods like
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Language: en
Pages: 250
Authors: Samuel H. Cohen
Categories: Technology & Engineering
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to
Atomic Force Microscopy for Biologists
Language: en
Pages: 352
Authors: V J Morris
Categories: Science
Type: BOOK - Published: 1999-12-02 - Publisher: World Scientific

Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electr
Kelvin Probe Force Microscopy
Language: en
Pages: 334
Authors: Sascha Sadewasser
Categories: Technology & Engineering
Type: BOOK - Published: 2011-10-22 - Publisher: Springer Science & Business Media

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise
Atomic Force Microscopy Investigations into Biology
Language: en
Pages: 372
Authors: Christopher Frewin
Categories: Medical
Type: BOOK - Published: 2012-03-07 - Publisher: BoD – Books on Demand

The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for materials science since its creation in the 1980's, but has