Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy
Author : Seizo Morita
Publisher : Springer Science & Business Media
Total Pages : 401
Release : 2009-09-18
ISBN 10 : 9783642014956
ISBN 13 : 364201495X
Language : EN, FR, DE, ES & NL

Noncontact Atomic Force Microscopy Book Description:

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.